Detector de partículas ionizantes basado en sensores de imagen CMOS comerciales y técnica de análisis y clasificación de eventos

Abstract

Disclosed is an ionising-particle detector which uses, for detection, a CMOS image sensor based on active-pixel sensors, the detector comprising a CMOS image sensor and an image processing unit, wherein the image processing unit eliminates fixed pattern noise (FPN), detects contiguous pixels with values above the threshold, calculates the charge generated, and emits the quantity of total charge as a result. The particle detector is based on an FPN-resistant technique. The technique allows any APS-based CMOS image sensor to be used to detect ionising particles, with a very low number of false detections caused by FPN.