Optimum noise conditions in a fet

Pinasco, Santiago Felipe

doi:https://doi.org/10.1016/0029-554X(67)90096-1

Optimum noise conditions in a fet

cnea.tipodocumento	ARTÍCULO CIENTÍFICO
dc.contributor.author	Pinasco, Santiago Felipe
dc.date.accessioned	2026-09-01T13:55:31Z
dc.date.issued	1967
dc.description.abstract	Lately some papers have been published about preamplifiers for solid State detectors and even commercial equipments exist in which these FET’s are used as an input element 1-3). In all of these papers excepted in the one by Nybakken and Vali4) the possibility of changing the operating point has not been taken into account. Even in the article just mentioned, there is hardly a possibility of changing the FET current without changing the operating conditions of the rest of the circuit.
dc.description.institutionalaffiliation	Fil: Pinasco, Santiago Felipe Comisión Nacional de Energía Atómica; Argentina
dc.format.extent	355-355 p.
dc.format.extent	application/pdf
dc.identifier.cnea	09.67.07
dc.identifier.doi	https://doi.org/10.1016/0029-554X(67)90096-1
dc.identifier.uri	https://nuclea.cnea.gob.ar/handle/20.500.12553/11680
dc.language.ISO639-3	eng
dc.publisher	North-Holland Publishing Co.
dc.relation.ispartof	Nuclear Instruments and Methods Vol. 47 (1), 1967
dc.rights.accesslevel	info:eu-repo/semantics/openAccess
dc.rights.license	Creative Commons Atribución-NoComercial-CompartirIgual 4.0 Internacional
dc.rights.uri	https://creativecommons.org/licenses/by-nc-sa/4.0/
dc.subject.inis	TRANSISTORES DE EFECTO DE CAMPO
dc.subject.inis	PREAMPLIFICADORES
dc.subject.inis	RUIDO
dc.subject.inis	FIELD EFFECT TRANSISTORS
dc.subject.inis	PREAMPLIFIERS
dc.subject.inis	NOISE
dc.title	Optimum noise conditions in a fet
dc.type	info:eu-repo/semantics/article
dc.type	info:ar-repo/semantics/artículo
dc.type.version	info:eu-repo/semantics/publishedVersion

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