Determinación del perfil de tensiones residuales superficiales en tubos de Zircaloy-4 sometidos al proceso de granallado mediante difracción de rayos X
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Comisión Nacional de Energía Atómica; Argentina. Gerencia de Área Académica. Gerencia Instituto de Tecnología "Jorge Sabato"
Universidad Nacional San Martin. Instituto de Tecnología "Jorge Sabato"; Argentina
Universidad Nacional San Martin. Instituto de Tecnología "Jorge Sabato"; Argentina
Resumen
El presente trabajo tiene como objetivo principal utilizar la metodología de medición de tensiones residuales por difracción de rayos-X (método sen²ψ) mediante el uso de un dispositivo de flexión pura usando diferentes configuraciones de la óptica del equipo. Una vez determinada la configuración experimental optima, se realizaron las mediciones de tensiones residuales superficiales en tubos de Zircaloy-4 sometidos a granallado. Para realizar el perfil de las tensiones en el espesor es necesario eliminar capas superficiales sucesivas de material por decapado, lo que hace necesario caracterizar este proceso adecuadamente. Por otro lado, se realizó un estudio cualitativo del perfil de deformación producido por el granallado mediante el uso de microdureza Vickers y el ancho de los picos de difracción obtenidos durante los ensayos de difracción.
The main objective of the present work is to use the methodology for measuring residual stresses by X-ray diffraction (sen²ψ method) with a pure bending device using different configurations of the equipment's optics. Once the optimal experimental configuration was determined, the measurements of superficial residual stresses were carried out in Zircaloy-4 tubes subjected to shot peening. To make the profile of the stresses in the thickness it is necessary to eliminate successive surface layers of material by polishing, which makes it necessary to characterize this process adequately. On the other hand, a qualitative study of the deformation profile produced by shot blasting was carried out using Vickers microhardness tests and the width of the diffraction peaks obtained during the diffraction tests.
The main objective of the present work is to use the methodology for measuring residual stresses by X-ray diffraction (sen²ψ method) with a pure bending device using different configurations of the equipment's optics. Once the optimal experimental configuration was determined, the measurements of superficial residual stresses were carried out in Zircaloy-4 tubes subjected to shot peening. To make the profile of the stresses in the thickness it is necessary to eliminate successive surface layers of material by polishing, which makes it necessary to characterize this process adequately. On the other hand, a qualitative study of the deformation profile produced by shot blasting was carried out using Vickers microhardness tests and the width of the diffraction peaks obtained during the diffraction tests.
