Electrons and X rays.

Publicación:
Electrons and X rays.

cnea.tipodocumento	ARTÍCULO CIENTÍFICO
dc.contributor.author	Ipohorski, M.
dc.date.accessioned	2022-10-20T14:48:42Z
dc.date.issued	1971
dc.description.abstract	André Guinier described some recent developments in x-ray small-angle scattering (SAS) techniques for the study of defects in metáis. Subsequently, in June 1970, Gareth Thomas published a letter (page 19) in praise of the advantages of electrón microscopy over x-ray methods. Having recently worked in both of these fields I should like to contribute some observations to this argument that are based on my own experience.
dc.description.institutionalaffiliation	Fil: Ipohorski, M. Comisión Nacional de Energía Atómica; Argentina
dc.format.extent	63 p.
dc.identifier.cnea	01.71.10
dc.identifier.uri	https://nuclea.cnea.gob.ar/handle/20.500.12553/2142
dc.language.ISO639-3	eng
dc.publisher	American Institute of Physics
dc.relation.ispartof	Phisics Today V. 24 Abr 1971
dc.rights.license	info:eu-repo/semantics/openAccess
dc.subject.keyword	X RADIATION
dc.subject.keyword	RAYOS X
dc.subject.keyword	ELECTRON MICROSCOPY
dc.subject.keyword	MICROSCOPIA ELECTRONICA
dc.subject.keyword	DISPERSION DE ANGULOS PEQUEÑOS
dc.subject.keyword	SMALL ANGLE SCATTERING
dc.title	Electrons and X rays.
dc.type	ARTÍCULO
dc.type.version	Versión publicada
dspace.entity.type	Publication

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