Synthesis and characterization of ZrO2 and YSZ thin films

Abstract

Zirconia-based ceramics possess a wide range of relevant applications due to its unique mechanical, electrical and optical properties. On the one hand, ZrO2 has a high mechanical and chemical resistance, which is suitable as protective coating. On the other hand, yttria-stabilized zirconia (YSZ) is one of the main electrolyte materials for solid oxide fuel cells (SOFC) devices due to its high ionic conductivity at high temperatures. In this work, ZrO2 and YSZ thin films synthesized by sol-gel method and deposited by dip coating is studied. ZrO2 films are synthesized as coatings for Zircaloy rod spacer grids used for critical heat flux tests, while YSZ films are synthesized for non-electrolyte supported SOFC. Morphological characterization of these films is performed by SEM, while TEM and XRD provide insight on the crystallographic properties. Electrical properties of these materials are measured by conductivity experiments. Highly dense films with good adherence to substrates and thickness above 200 nm are achieved by this method. The nano grain size allows to obtain high symmetry phase stabilization, which enhance the desired properties in both materials for the proposed applications.