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Charged Particle Optics of Magnetic Sector Spectrometers with H = Hφ x r-1 (z,r,φ cylindrical coordinates with he z- axis the object-image line)

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Argonne National Laboratory; Estados Unidos

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The charged particle optics of symmetric and asymmetric spectrometers is developed, taking into account the effeets of fringing fields. Formulae are given for: the image of point and extended sources, and their resolution and transmission. The suppression of ghost peaks arising from multiloop trajectories is studied. Methods and tables for the calculation of instruments are given. A comparison is made between various instruments already constructed, and some general considerations concerning the choice of design parameters are presented. The charged particle optics of symmetric and asymmetric spectrometers is developed, taking into account the effeets of fringing fields. Formulae are given for: the image of point and extended sources, and their resolution and transmission. The suppression of ghost peaks arising from multiloop trajectories is studied. Methods and tables for the calculation of instruments are given. A comparison is made between various instruments already constructed, and some general considerations concerning the choice of design parameters are presented. Tables include: general trajectory functions; profile curves; and dispersión and transmission functions for symmetrical instruments.

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